发明名称 TESTING METHOD AND TESTING SUBSTRATE
摘要 PROBLEM TO BE SOLVED: To easily know distribution of plasma. SOLUTION: A testing substrate 101 is prepared which comprises a test pattern region consisting of a recess 102b, a recess 102c, a recess 102d, and a recess 102e. Then, a mask layer 103 is formed on the testing substrate 101 where the recesses are formed and a plurality of openings 104 are formed in the mask layer 103. After the testing substrate 101 is prepared, the testing substrate 101 is exposed to the plasma of C<SB>4</SB>F<SB>8</SB>gas, so that a protective film (deposits) 110 is formed on the side surface of the openings 104, on the surface of a region 102a, on a bottom part 105b and side wall 106b of the recess 102b, on a bottom part 105c and side wall 106c of the recess 102c, on a bottom part 105d of a part of the recess 102d, and on a bottom part 105e of a part of the recess 102e. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008153334(A) 申请公布日期 2008.07.03
申请号 JP20060338093 申请日期 2006.12.15
申请人 NIPPON TELEGR & TELEPH CORP <NTT>;NTT ADVANCED TECHNOLOGY CORP 发明人 SATO NORIO;ISHII HITOSHI;KAMEI TOSHIKAZU
分类号 H01L21/66 主分类号 H01L21/66
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