发明名称 METHOD FOR MEASURING MICRO DISPLACEMENTS
摘要 A method for measuring micro displacements generally includes the steps of: (a) providing a micro displacement sensor with a first photonic crystal module with a number of first crystals, a second photonic crystal module with a number of second crystals, a laser, and a detector; the first crystal module and the second crystal module having a first light guide channel and a second light guide channel therein, respectively; (b) securing the second crystal module onto a sample, the first channel and the second channel being optically coupled together; and (c) during operation, emitting light from the laser, directing such light into the first channel, a first portion of the light exiting from the first channel and a second portion of the light entering the second channel, and analyzing a "light intensity vs. displacement" sine curve to obtain a horizontal micro displacement of the sample.
申请公布号 US2008159686(A1) 申请公布日期 2008.07.03
申请号 US20070964554 申请日期 2007.12.26
申请人 TSINGHUA UNIVERSITY;HON HAI PRECISION INDUSTRY CO., LTD. 发明人 XU ZHEN-FENG;JIN GUO-FAN
分类号 G02B6/00 主分类号 G02B6/00
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