发明名称 LITHOGRAPHIC APPARATUS, SUBSTRATE TABLE, AND METHOD FOR ENHANCING SUBSTRATE RELEASE PROPERTIES
摘要 <p>A lithographic apparatus includes an illumination system constructed and arranged to condition a radiation beam, and a support constructed and arranged to support a patterning device. The patterning device is capable of imparting the radiation beam with a pattern in its cross-section to form a patterned radiation beam. The apparatus also includes a substrate table constructed and arranged to hold a substrate, and a projection system constructed and arranged to project the patterned radiation beam onto a target portion of the substrate. The substrate table includes a chuck having a plurality of protrusions constructed and arranged to support corresponding parts of a bottom surface of a wafer. The top surface of at least one of the protrusions includes a plurality of elements that define a reduced contact area between the substrate and the top surface of the protrusion.</p>
申请公布号 WO2008078992(A1) 申请公布日期 2008.07.03
申请号 WO2007NL50657 申请日期 2007.12.17
申请人 ASML NETHERLANDS B.V.;PUYT, MICHIEL;BLEEKER, ARNO JAN;FRANSSEN, JOHANNES HENDRIKUS GERTRUDIS;COMPEN, RENE THEODORUS PETRUS;VAN DE VEN, JOHANNES THEODORUS GUILLIELMUS MARIA;STAM, EGBERT DIRK;FISCHER, RUDOLF HARTMUT;GELINCK, EDWIN ROBERT MARTIN 发明人 PUYT, MICHIEL;BLEEKER, ARNO JAN;FRANSSEN, JOHANNES HENDRIKUS GERTRUDIS;COMPEN, RENE THEODORUS PETRUS;VAN DE VEN, JOHANNES THEODORUS GUILLIELMUS MARIA;STAM, EGBERT DIRK;FISCHER, RUDOLF HARTMUT;GELINCK, EDWIN ROBERT MARTIN
分类号 G03F7/20;H01L21/683 主分类号 G03F7/20
代理机构 代理人
主权项
地址