INSERT MODULE FOR TEST TRAY OF TEST HANDLER AND TEST HANDLER

摘要

An insert module for a test tray of a test handler and the test handler are provided to reduce a cost for replacement by applying the same insert module to semiconductor devices of various sizes. An insert module for a test tray of a test handler includes an insert main body(1710) and at least one varying unit(1720X, 1720Y). The insert main body includes a receiving space(S) to receive a semiconductor device. At least one varying unit is installed on the insert main body and changes a receiving size of the semiconductor device received on the receiving space. At least one varying unit includes an X axial varying unit and an Y axial varying unit. The X axial varying unit varies the receiving size in an X axial direction on an XY plane of the receiving space. The Y axial varying unit varies the receiving size in a Y axial direction on the XY plane of the receiving space.