发明名称 SEMICONDUCTOR DEVICE
摘要 A semiconductor apparatus is provided to improve the uniformity of an output by measuring an illumination region with one light sensor. A light detecting circuit(2900) includes a light sensor(2901) and a current voltage converting circuit(2902). A comparing circuit(2904) compares an output voltage with a reference voltage of the light detecting circuit. A control circuit(2906) outputs a control signal on the basis of the output signal of the comparing circuit. A resistance value of the current voltage converting circuit is controlled by the control signal. The light sensor includes a photo diode. The reference voltage is generated by a reference voltage generating circuit(2905). The light detecting circuit is electrically connected to the comparing circuit through an amplifier. The light sensor outputs a current signal corresponding to the detected illumination. The current voltage converting circuit converts the current signal into a voltage signal.
申请公布号 KR20080063198(A) 申请公布日期 2008.07.03
申请号 KR20070140695 申请日期 2007.12.28
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 YOSHIDA YASUNORI
分类号 H01L31/09;H01L31/101 主分类号 H01L31/09
代理机构 代理人
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