发明名称 Integrated compound nano probe card and method of making same
摘要 An integrated compound nano probe card is disclosed to include a substrate layer having a front side and a back side, and compound probe pins arranged in the substrate layer. Each compound probe pin has a bundle of aligned parallel nanotubes/nanorods and a bonding material bonded to the bundle of aligned parallel nanotubes/nanorods and filled in gaps in the nanotubes/nanorods. Each compound probe pin has a base end exposed on the back side of the substrate layer and a distal end spaced above the front side of the substrate layer.
申请公布号 US2008160195(A1) 申请公布日期 2008.07.03
申请号 US20080071310 申请日期 2008.02.20
申请人 INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE 发明人 WANG HORNG-JEE;HUANG YA-RU;CHOU MIN-CHIEH
分类号 B05D5/00;G01R1/067;G01R1/073;G01R3/00 主分类号 B05D5/00
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