发明名称 DEVICE AND METHOD FOR DETERMINING LAMINATION QUALITY OF TAPE MEMBER
摘要 PROBLEM TO BE SOLVED: To determine whether or not a tape member (an ACF or the like) for connecting an electronic component is stuck properly on a substrate surface constituting a liquid crystal display panel or the like. SOLUTION: Lightness threshold levels Su, Sd are set on an upper part and a lower part between a lightness level of the ACF 4. A CPU 72 extracts binary signals (Fig.4(ab), Fig.4(bb)) from an imaging pattern (Fig.4(aa)) of a glass substrate 2 on which the ACF 4 is stuck properly and an imaging pattern (Fig.4(ba)) of a quality determination object substrate 2 in the stuck state based on the set lightness threshold levels Su, Sd, and determines lamination quality of the tape member (ACF 4) on the glass substrate 2 from the coincidence rate (α) between both shapes. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008151685(A) 申请公布日期 2008.07.03
申请号 JP20060340990 申请日期 2006.12.19
申请人 SHIBAURA MECHATRONICS CORP 发明人 NAKAMURA KENTARO
分类号 G01N21/956;H01L21/60;H05K3/32;H05K3/34 主分类号 G01N21/956
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