发明名称 INSERT MODULE FOR TEST TRAY OF TEST HANDLER
摘要 An insert module for a test tray of a test handler and the test handler are provided to prevent a contact failure or short between a test socket and a semiconductor device by aligning the position and posture of a semiconductor device loaded on the insert module. An insert body(410) has a receiving space for receiving a semiconductor device. One or more alignment units are installed on the insert body to align the position and/or posture of the semiconductor device being loaded on the receiving space in the insert body. The one or more alignment units include an X-axis alignment unit(420X) for aligning a position in an X-axis direction on an X-Y plane of the receiving space, and an Y-axis alignment unit(420Y) for aligning a position in an Y-axis direction on the X-Y plane of the receiving space. A holding unit is prepared to hold the semiconductor device aligned by the alignment.
申请公布号 KR20080062984(A) 申请公布日期 2008.07.03
申请号 KR20060139223 申请日期 2006.12.30
申请人 TECHWING CO., LTD. 发明人 SHIM, JAE GYUN;NA, YUN SUNG;JEON, IN GU;KU, TAE HUNG;HWANG, JUNG WOO
分类号 H01L21/66;H01L21/68 主分类号 H01L21/66
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