发明名称 ELECTROSTATIC DISCHARGE PROTECTION CIRCUIT PROTECTING THIN GATE INSULATION LAYERS IN A SEMICONDUCTOR DEVICE
摘要 An electrostatic discharge protection circuit protects the internal circuits of a semiconductor. The electrostatic discharge protection circuit includes a first electrostatic protection unit connected to a power source supply pad. The first electrostatic protection unit discharges an ESD current into the power source supply pad when an ESD is introduced into the input/output pad, and generates a first driving voltage by utilizing the ESD current flow through a voltage-drop unit. A driver driven by the first driving voltage generates a second driving voltage by an ESD current. A second electrostatic protection unit discharges the introduced ESD current into the power source supply pad by the second driving voltage such that a voltage applied to a gate of the first NMOS transistor is reduced.
申请公布号 US2008158749(A1) 申请公布日期 2008.07.03
申请号 US20080045967 申请日期 2008.03.11
申请人 KWAK KOOK WHEE;CHOI NAK HEON 发明人 KWAK KOOK WHEE;CHOI NAK HEON
分类号 H02H9/04 主分类号 H02H9/04
代理机构 代理人
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