发明名称 EXPOSURE APPARATUS AND EXPOSING METHOD
摘要 <p>Exposure equipment is provided to selectively adjust the aspect ratio of a two-dimensional island-type pattern by transmitting a light source formed by a quadrapole DOE(diffractive optical element) to first and second linear polarization plates wherein the polarization angle of the second linear polarization plate with respect to the X-axis or Y-axis direction is varied to adjust the intensity of diffraction light in the X-axis or Y-axis direction. Exposure equipment including a quadrapole DOE has a first linear polarization plate and a second linear polarization plate having a different polarization angle from that of the first linear polarization plate. The first and second linear polarization plates are sequentially formed in the progression direction of a light source. The first linear polarization plate can linearly be polarized in the X-axis or Y-axis direction. The exposure equipment can be designed to adjust the polarization angle of the second linear polarization plate.</p>
申请公布号 KR20080061847(A) 申请公布日期 2008.07.03
申请号 KR20060136992 申请日期 2006.12.28
申请人 HYNIX SEMICONDUCTOR INC. 发明人 JUN, HYUN SOOK
分类号 H01L21/027 主分类号 H01L21/027
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