发明名称 |
METHOD OF MANUFACTURING A FLASH MEMORY DEVICE |
摘要 |
<p>A method of manufacturing a flash memory device is provided to keep the height of a conductive layer uniformly by using a wet etching solution of large etch selectivity when patterning the conductive layer, thereby enhancing the operating speed. A gate insulation layer is formed on a semiconductor substrate(100). A device isolation layer(110), which is protruded higher than the semiconductor substrate, is formed in an isolation region of the substrate. A first conductive layer is formed at a sidewall of the device isolation layer and at an upper part of the gate insulation layer.</p> |
申请公布号 |
KR20080061475(A) |
申请公布日期 |
2008.07.03 |
申请号 |
KR20060136233 |
申请日期 |
2006.12.28 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
SHIN, SEUNG WOO;LEE, SANG SOO;DONG, CHA DEOK;SHON, HYUN SOO;JEONG, WOO RI |
分类号 |
H01L27/115;H01L21/8247 |
主分类号 |
H01L27/115 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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