发明名称 METHOD OF MANUFACTURING A FLASH MEMORY DEVICE
摘要 <p>A method of manufacturing a flash memory device is provided to keep the height of a conductive layer uniformly by using a wet etching solution of large etch selectivity when patterning the conductive layer, thereby enhancing the operating speed. A gate insulation layer is formed on a semiconductor substrate(100). A device isolation layer(110), which is protruded higher than the semiconductor substrate, is formed in an isolation region of the substrate. A first conductive layer is formed at a sidewall of the device isolation layer and at an upper part of the gate insulation layer.</p>
申请公布号 KR20080061475(A) 申请公布日期 2008.07.03
申请号 KR20060136233 申请日期 2006.12.28
申请人 HYNIX SEMICONDUCTOR INC. 发明人 SHIN, SEUNG WOO;LEE, SANG SOO;DONG, CHA DEOK;SHON, HYUN SOO;JEONG, WOO RI
分类号 H01L27/115;H01L21/8247 主分类号 H01L27/115
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