发明名称 CMP SLURRY COMPOSITION FOR METAL WIRE
摘要 A chemical mechanical polishing slurry composition is provided to ensure high selectivity of the polishing rate between a metal layer and an insulating layer. A chemical mechanical polishing slurry composition for metal wire includes 0.1-5wt% of KIO3, 0.01-2wt% of an organic acid, 0.1-30wt% of silica, and 63-99wt% of pure water. The organic acid is at least one selected from the group comprising acetic acid, citric acid, glutamic acid, glycolic acid, formic acid, lactic acid, malic acid, maleic acid, oxalic acid, phthalic acid, succinic acid, tartaric acid, and malonic acid. The slurry composition further comprises tetramethyl ammonium hydroxide.
申请公布号 KR20080062021(A) 申请公布日期 2008.07.03
申请号 KR20060137271 申请日期 2006.12.28
申请人 CHEIL INDUSTRIES INC. 发明人 KANG, DONG HUN;CHOI, WON YOUNG;KIM, WON LAE;LEE, IN KYUNG
分类号 C09K3/14 主分类号 C09K3/14
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