发明名称 REAL TIME TARGET TOPOGRAPHY TRACKING DURING LASER PROCESSING
摘要 <p>An efficient method of and a system (90) for performing topography measurement facilitates increasing laser machining throughput. Topography measurements at multiple points on a target specimen (30) or continuous real time measurement and monitoring of the target specimen surface topography (66) and target specimen thickness (70) can be performed during a laser machining process. Measurement of the thickness of the target specimen to be laser machined would permit fine tuning of laser energy (28) delivered and result in higher quality target material removal.</p>
申请公布号 KR20080061372(A) 申请公布日期 2008.07.02
申请号 KR20087009107 申请日期 2006.10.17
申请人 ELECTRO SCIENTIFIC INDUSTRIES, INC. 发明人 KOSMOWSKI MARK
分类号 B23K26/04;B23K26/00;B23K26/02;B23K26/08 主分类号 B23K26/04
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