发明名称 |
REAL TIME TARGET TOPOGRAPHY TRACKING DURING LASER PROCESSING |
摘要 |
<p>An efficient method of and a system (90) for performing topography measurement facilitates increasing laser machining throughput. Topography measurements at multiple points on a target specimen (30) or continuous real time measurement and monitoring of the target specimen surface topography (66) and target specimen thickness (70) can be performed during a laser machining process. Measurement of the thickness of the target specimen to be laser machined would permit fine tuning of laser energy (28) delivered and result in higher quality target material removal.</p> |
申请公布号 |
KR20080061372(A) |
申请公布日期 |
2008.07.02 |
申请号 |
KR20087009107 |
申请日期 |
2006.10.17 |
申请人 |
ELECTRO SCIENTIFIC INDUSTRIES, INC. |
发明人 |
KOSMOWSKI MARK |
分类号 |
B23K26/04;B23K26/00;B23K26/02;B23K26/08 |
主分类号 |
B23K26/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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