发明名称 METHOD FOR MANUFACTURING NON VOLATILE MEMORY DEVICE
摘要 <p>A method for manufacturing a non-volatile memory device is provided to increase a contact area of a dielectric layer formed on a conductive layer by increasing a roughness of an upper surface of the conductive layer. A first conductive layer(102) for floating gate is separated electrically by an isolation layer. A second conductive layer(107A) for floating gate is formed on the first conductive layer for floating gate including the isolation layer. The entire surface of the second conductive layer is etched to a predetermined thickness. A roughness of an upper surface of the second conductive layer is increased by generating a polymer. A part of the second conductive layer is etched to expose the isolation layer and to form a floating gate isolated.</p>
申请公布号 KR20080060358(A) 申请公布日期 2008.07.02
申请号 KR20060134323 申请日期 2006.12.27
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KO, EUN JUNG
分类号 H01L27/115;H01L21/8247 主分类号 H01L27/115
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