发明名称 REPAIR FUSE CIRCUIT AND REPAIR FUSE TEST METHOD
摘要 A repair fuse circuit and a repair fuse test method are provided to reduce fabrication time and cost by detecting repair fuse failure in advance. A driving part(10) outputs an address coding signal enabling one of a normal address path and a repair address path according to a blowing state of a repair fuse. A test mode response type latch part(20) transfers the address coding signal, and latches the address coding signal selectively according to test mode entry. The test mode response type latch part does not latch the address coding signal in correspondence to power down during test mode entry.
申请公布号 KR100842912(B1) 申请公布日期 2008.07.02
申请号 KR20060137163 申请日期 2006.12.28
申请人 HYNIX SEMICONDUCTOR INC. 发明人 LEE, YIN JAE
分类号 G11C29/00 主分类号 G11C29/00
代理机构 代理人
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