发明名称 METHOD OF MANUFACTURING A FLASH MEMORY DEVICE
摘要 <p>A manufacturing method of a flash memory is provided to minimize a step difference between a cell region and a peripheral region by leaving an ONA film and a metal film in the cell region only. A cell region and a peripheral region are defined on a semiconductor substrate(100). A first conductive layer(104) is formed at the peripheral region. A second conductive layer(110) and a dielectric layer are formed on the semiconductor substrate. The dielectric layer and the second conductive layer are removed. A third conductive layer is formed on the semiconductor substrate. The third conductive layer, the dielectric layer, the second conductive layer and the first conductor layer are etched. The first conductive layer is formed out of a polysilicon layer.</p>
申请公布号 KR20080060559(A) 申请公布日期 2008.07.02
申请号 KR20060134813 申请日期 2006.12.27
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KIM, SUK GOO
分类号 H01L27/115;H01L21/8247 主分类号 H01L27/115
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