发明名称 PHASE CHANGE MEMORY DEVICE AND METHODS OF MANUFACTURING AND OPERATING THE SAME
摘要 <p>A phase change memory device, a manufacturing method thereof, and a driving method thereof are provided to maintain characteristics of a program region by preventing unnecessary heat from being delivered to the program region. A phase change memory device includes a switching element and a storage node, which is connected to the switching element. The storage node includes a lower electrode(56), a phase change layer(62), a material layer, and an upper electrode(64). The phase change layer is formed on the lower electrode. The material layer is formed on the phase change layer. The upper electrode is formed on the phase change layer around a material layer. Electrical conductivity of the material layer is smaller than that of the upper electrode.</p>
申请公布号 KR20080060918(A) 申请公布日期 2008.07.02
申请号 KR20060135545 申请日期 2006.12.27
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 HUR, JI HYUN;KANG, YOON HO;LEE, HYO SUG;CHOI, HYUK SOON;SHIN, JAI KWANG;OH, JAE JOON
分类号 H01L27/115 主分类号 H01L27/115
代理机构 代理人
主权项
地址