发明名称 OVERLAY VERNIER AND METHOD FOR FORMING OVERLAY VERNIER PATTERN USING THE SAME
摘要 <p>An overlay vernier and a method of forming a vernier pattern using the same are provided to prevent exfoliation of an overlay vernier pattern by increasing a contact area between a wafer and the overlay vernier pattern. An overlay vernier(10) comprises a light shielding layer(12A), and a light transmitting layer(14) which is formed within the light shielding layer as a quadrate structure. Wherein, the light shielding layer is made of Cr, and the light transmitting layer is made of a quartz substrate(11).</p>
申请公布号 KR20080060323(A) 申请公布日期 2008.07.02
申请号 KR20060134273 申请日期 2006.12.27
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KIM, WON KI
分类号 H01L21/027 主分类号 H01L21/027
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