发明名称 |
Apparatus for measuring specular reflectance of a sample |
摘要 |
<p>An accessory for a spectrometer for carrying out measurements of specular reflectance of a sample. The accessory is designed so that all components are located in a housing and the sample is located horizontally on a top-plate of the housing with the components disposed below the plane of that plate. The accessory comprises four reflectors which direct the incoming beam to the sample. The reflected light from the sample is detected by a detector located inside the housing.</p> |
申请公布号 |
EP1939595(A2) |
申请公布日期 |
2008.07.02 |
申请号 |
EP20080075194 |
申请日期 |
2004.01.20 |
申请人 |
PERKINELMER LTD. |
发明人 |
HOULT, ROBERT ALAN;EVETTS, PAUL ALEXANDER |
分类号 |
G01J3/44;G01J3/42;G01N21/55 |
主分类号 |
G01J3/44 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|