发明名称 Menetelmä ja laite impedanssin mittaamiseksi
摘要 The invention relates to a method and system and microchip for determining impedance of a variable impedance component. The method comprises tuning a tunable oscillator over a predefined tuning range, the tunable oscillator having the variable impedance component coupled as a load thereof. The frequency response of the tunable oscillator is measured as a function of said tuning. Finally, the measured frequency response is analyzed for determining the impedance of the variable impedance component. The invention makes possible to manufacture smaller and simpler monolithic sensor microchips.
申请公布号 FI20085682(A0) 申请公布日期 2008.07.01
申请号 FI20080005682 申请日期 2008.07.01
申请人 VALTION TEKNILLINEN TUTKIMUSKESKUS, 发明人 RANTALA,ARTO
分类号 G01R 主分类号 G01R
代理机构 代理人
主权项
地址