Circuit and method for fuse disposing in a semiconductor memory device

摘要

A fuse disposing circuit executes a same test as in a state before a fuse is cut, even in case the fuse is cut. For this, the fuse disposing circuit in accordance with the invention includes a test mode enable confirmation section for informing whether a test mode is enabled; and a fuse set for providing a constant signal by using the output from the test mode enable confirmation section in case of the test mode, regardless of elimination or non-elimination of a fuse.