发明名称 Low temperature methods of etching semiconductor substrates
摘要 Methods of etching a semiconductor substrate may include providing a first gas that is chemically reactive with respect to the semiconductor substrate, and while providing the first gas, providing a second gas different than the first gas. More particularly, a molecule of the second gas may include a hydrogen atom, and the second gas may lower a temperature at which the first gas chemically reacts with the semiconductor substrate. The mixture of the first and second gases may be provided adjacent the semiconductor substrate to etch the semiconductor substrate.
申请公布号 US7393700(B2) 申请公布日期 2008.07.01
申请号 US20050208490 申请日期 2005.08.22
申请人 SAMSUNG ELECTRONIC CO., LTD. 发明人 LEE SUN-GHIL;SHIN YU-GYUN;LEE JONG-WOOK;LEE DEOK-HYUNG;JUNG IN-SOO;LEE YOUNG-EUN
分类号 H01L21/302 主分类号 H01L21/302
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