发明名称 |
Testing apparatus, testing method, jitter filtering circuit, and jitter filtering method |
摘要 |
There is provided a testing apparatus for evaluating a device-under-test, having an extracting section for extracting jitter components out of an output signal outputted out of the device-under-test, a filter for passing predetermined frequency components in the jitter components, a phase control section for controlling phase of the output signal based on the jitter components outputted out of the filter and an evaluating section for evaluating the device-under-test based on a signal outputted out of the phase control section.
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申请公布号 |
US7394277(B2) |
申请公布日期 |
2008.07.01 |
申请号 |
US20060407136 |
申请日期 |
2006.04.20 |
申请人 |
ADVANTEST CORPORATION |
发明人 |
ISHIDA MASAHIRO;ICHIYAMA KIYOTAKA;YAMAGUCHI TAKAHIRO |
分类号 |
G01R31/26 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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