发明名称 Temperature conditioned load lock, lithographic apparatus comprising such a load lock and method of manufacturing a substrate with such a load lock
摘要 A load lock for a lithographic apparatus is arranged to transfer an object, like a substrate, into and from the lithographic apparatus. The load lock outer wall defining at least part of a load lock volume accommodating a support unit for supporting the object when in the load lock. The load lock also has a temperature conditioned structure to control the temperature of the object to a desired temperature at least before the object is transferred from the load lock towards the lithographic projection apparatus.
申请公布号 US7394520(B2) 申请公布日期 2008.07.01
申请号 US20040797608 申请日期 2004.03.11
申请人 ASML NETHERLANDS B.V. 发明人 KLOMP ALBERT JAN HENDRIK;HOOGKAMP JAN FREDERIK;VISSER RAIMOND;VUGTS JOSEPHUS CORNELIUS JOHANNES ANTONIUS;VULLINGS HENRICUS JOHANNES LOUIS MARIE;KUIPERS LEO WILHELMUS MARIA;FRANSSEN JOHANNES HENDRIKUS GERTRUDIS
分类号 G03B27/52;H01L21/027;G03B27/42;G03F7/20;H01L21/68 主分类号 G03B27/52
代理机构 代理人
主权项
地址