发明名称 PROCESS OF SEMICONDUCTOR DEVICE MANUFACTURING IN SEMICONDUCTOR STRUCTURE AND DEVICE OBTAINED IN THIS PROCESS
摘要 FIELD: physics. ^ SUBSTANCE: process of semiconductor device manufacturing in semiconductor structure provides improved quantum well intermixing in the desired parts of the device by forming of high-quality epitaxial layer on substrate, the layer featuring a quantum well; forming of second, low-quality flawed epitaxial layer over the high-quality layer; and thermal processing of the structure for obtaining of at least partial diffusion of flaws to the high-quality layer for intermixing of quantum wells in the structure. At that, flawed epitaxial layer is formed by change of original element ratio during growth beyond ideal or stoichiometrical conditions for obtaining crystal lattice flaws. Also a device manufactured by this process is offered. ^ EFFECT: quantum well intermixing at lower temperatures and improvement of the device characteristics. ^ 22 cl, 12 dwg
申请公布号 RU2328065(C2) 申请公布日期 2008.06.27
申请号 RU20050116843 申请日期 2003.10.30
申请人 INTENS LIMITED 发明人 NEHZHDA STIVEN PITER
分类号 H01S5/34 主分类号 H01S5/34
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