发明名称 |
PRECISE X-RAY INSPECTION SYSTEM UTILIZING MULTIPLE LINEAR SENSORS |
摘要 |
<p>PRECISE Y-RAY INSPECTION SYSTEM UTILIZING MULTIPLE LINEAR SENSORS An x-ray inspection is provided featuring a single x-ray source and a planar array of linear sensors aligned in parallel. An article to be inspected is moved between the x-ray source and the linear sensors in a series of passes parallel to the array of linear sensors and substantially perpendicular to the long axes of the linear sensors. Alternately, the x-ray source and the sensors are moved as a unit relative to a stationary article. As a result, a transmission image of the article is captured for each of the linear sensors. These transmission images are then combined mathematically to generate a layer image for each separate conceptual layer of the article. In some embodiments, these layer images may then be interpreted in order to determine the quality of the article.</p> |
申请公布号 |
SG143039(A1) |
申请公布日期 |
2008.06.27 |
申请号 |
SG20040020632 |
申请日期 |
2004.03.17 |
申请人 |
AGILENT TECHNOLOGIES, INC. |
发明人 |
MEYER GERALD L |
分类号 |
G01N23/04;(IPC1-7):G01N23/04 |
主分类号 |
G01N23/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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