发明名称 Method for manufacturing semiconductor device
摘要 A method for manufacturing a semiconductor device includes implanting metal ions on a residual interlayer dielectric film in a storage contact hole to metallize the residual dielectric film, thereby reducing a contact resistance to prevent failures of the semiconductor device.
申请公布号 US2008153288(A1) 申请公布日期 2008.06.26
申请号 US20070819857 申请日期 2007.06.29
申请人 HYNIX SEMICONDUCTOR INC. 发明人 JUNG SANG YONG
分类号 H01L21/44 主分类号 H01L21/44
代理机构 代理人
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