| 摘要 |
<p>The invention pertains to the field of design and exploitation of electronic systems submitted to an ionising radiating environment having a natural or artificial origin. The invention relates to a method for simulating the failure rate of an electronic equipment submitted to naturally occurring atmospheric neutronic radiation. Using the geographical location parameters of the equipment, i.e. longitude, latitude and altitude, and using the known grid width of the transistors used for the electronic components of the equipment, said width being representative of the technology used, the method can be used for determining the provisional failure rate of the equipment due to neutronic radiation.</p> |
