发明名称 SEMI-CONDUCTOR INTEGRATED CIRCUIT, AND APPARATUS AND METHOD FOR MONITORING
摘要 PROBLEM TO BE SOLVED: To monitor whether anomalies have occurred within a DMA chip when the DMA chip transfers a data through a direct memory access by dividing the data. SOLUTION: A transfer direction retaining unit 423 instructs a data length and an address to be transferred by a DMA circuit 421. An expected value table 424 retains expected values for the data length and the address to be transferred by the DMA circuit 421 by referring to the transfer direction through the transfer direction retaining unit 423. A transfer monitoring unit 425 obtains the data length and tag information on a bus 47, A table updating unit 426 updates a beginning address for the expected value table 424 and the data length based on a tag information and the data length, both of which are informed through the transfer monitoring unit 425. A determining unit 427 determines whether or not the beginning address corresponding to the DMA circuit 421 that has transferred the data matches an ending address and also the data length becomes 0 [zero]. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008146546(A) 申请公布日期 2008.06.26
申请号 JP20060335603 申请日期 2006.12.13
申请人 FUJITSU LTD 发明人 ISHII TAKANORI;ARATAKI NIINA
分类号 G06F13/28 主分类号 G06F13/28
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