| 摘要 |
A test handler and a method for supplying a tray are provided to take in/out a customer tray placed with a semiconductor device before test, automatically as being loaded in a cassette. According to a test handler testing and classifying semiconductor devices placed in a customer tray, a loading part(110a) takes in/out a cassette loaded with the customer tray automatically by a supply part(120). A pickup part(130) tests the semiconductor device by picking up the customer tray loaded in the loading part. An unloading part(140) is loaded with a tray placed with test-completed semiconductor devices. A sub loading part(110b) is installed on the bottom of the loading part. |
