发明名称 MEMORY DEVICE AND SEMICONDUCTOR INTEGRATED CIRCUIT
摘要 A memory device and a semiconductor integrated circuit are provided to increase access efficiency by enabling a plurality of banks stored with access target data, in response to a first operation code, and to prevent degradation of effective bandwidth. A memory device includes a memory cell array including a plurality of word lines allocated to different row addresses, N banks(92) allocated to different bank addresses, and a row control part(87) controlling enabling of a word line in the bank in response to a first operation code. The row control part includes a multi bank enable control part and a row address calculation part. The multi bank enable control part generates a bank enable signal of M banks, according to a supplied bank address and multi bank information data supplied with the first operation code. The row address calculation part generates a row address of the M enabled banks, according to the supplied bank address and a supplied row address. The M enabled banks enable at least one word line according to the bank enable signal and a row address generated by the row address calculation part.
申请公布号 KR20080059031(A) 申请公布日期 2008.06.26
申请号 KR20070108363 申请日期 2007.10.26
申请人 FUJITSU LIMITED 发明人 IKEDA HITOSHI;SATO TAKAHIKO;KANDA TATSUYA;UCHIDA TOSHIYA;KOBAYASHI HIROYUKI;SHIRAKAWA SATORU;MIYAMOTO TETSUO;YAMAMOTO YOSHINOBU;OTSUKA TATSUSHI;TAKAHASHI HIDENAGA;KURITA MASANORI;KAMATA SHINNOSUKE;SATO AYAKO
分类号 G11C8/00;G06F12/00;H04N5/907 主分类号 G11C8/00
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