发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT AND METHOD FOR MEASURING TERMINAL RESISTANCE OF THE SEMICONDUCTOR INTEGRATED CIRCUIT
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit capable of reducing the number of input/output terminals, while enabling correct measurement of the resistance value of a terminal resistor. SOLUTION: The semiconductor integrated circuit 100 is equipped with a differential input receiver circuit 4, whose output is connected to a logic circuit 1 and which is provided for receiving a signal that propagate through a transmission line and outputting the signal to the logic circuit 1, and a control circuit 16. In a test operating mode for measuring the resistance value of the terminal resistor 5, a control circuit 16 turns off a first switching circuit 8 and a second switching circuit 9, and additionally, turns on a third switching circuit 10 and a fourth switching circuit 11. In a normal operating mode for performing normal operation, the control circuit turns on the first switching circuit 8 and the second switching circuit 9, as well as, turns off the third switching circuit 10 and the fourth switching circuit 11. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008145253(A) 申请公布日期 2008.06.26
申请号 JP20060332363 申请日期 2006.12.08
申请人 TOSHIBA CORP 发明人 TERAUCHI RYOTA
分类号 G01R31/28;G01R27/02;H01L21/822;H01L27/04 主分类号 G01R31/28
代理机构 代理人
主权项
地址