发明名称 |
SYSTEM AND METHOD FOR MEMORY ELEMENT CHARACTERIZATION |
摘要 |
A system and method for analyzing a memory element includes modeling the memory element using a simulation method and determining component response characteristics for components of the memory element. Safety regions are computed in a state space of the memory element, which indicate stable states. A transient analysis is performed to determine a path and time needed to reach one of the safety regions. Based on the path and time needed to reach one of the safety regions, a clock waveform or waveforms are determined which place a corresponding state in that safety region.
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申请公布号 |
US2008155484(A1) |
申请公布日期 |
2008.06.26 |
申请号 |
US20080034811 |
申请日期 |
2008.02.21 |
申请人 |
AGRAWAL BHAVNA;FELDMANN PETER;NASSIF SANI R;NOWICKI TOMASZ J;SWIRSZCZ GRZEGORZ MICHAL |
发明人 |
AGRAWAL BHAVNA;FELDMANN PETER;NASSIF SANI R.;NOWICKI TOMASZ J.;SWIRSZCZ GRZEGORZ MICHAL |
分类号 |
G06F17/50 |
主分类号 |
G06F17/50 |
代理机构 |
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