发明名称 SYSTEM AND METHOD FOR MEMORY ELEMENT CHARACTERIZATION
摘要 A system and method for analyzing a memory element includes modeling the memory element using a simulation method and determining component response characteristics for components of the memory element. Safety regions are computed in a state space of the memory element, which indicate stable states. A transient analysis is performed to determine a path and time needed to reach one of the safety regions. Based on the path and time needed to reach one of the safety regions, a clock waveform or waveforms are determined which place a corresponding state in that safety region.
申请公布号 US2008155484(A1) 申请公布日期 2008.06.26
申请号 US20080034811 申请日期 2008.02.21
申请人 AGRAWAL BHAVNA;FELDMANN PETER;NASSIF SANI R;NOWICKI TOMASZ J;SWIRSZCZ GRZEGORZ MICHAL 发明人 AGRAWAL BHAVNA;FELDMANN PETER;NASSIF SANI R.;NOWICKI TOMASZ J.;SWIRSZCZ GRZEGORZ MICHAL
分类号 G06F17/50 主分类号 G06F17/50
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