发明名称 INSPECTION DATA CREATION METHOD AND INSPECTION METHOD
摘要 PROBLEM TO BE SOLVED: To provide an inspection data creation method for creating inspection data that is suitable for inspecting a pattern formed by multiple exposures. SOLUTION: This inspection data creation method is used for an inspection method, wherein patterns in the same layer on a substrate formed by multiple exposure by using a plurality of photomasks are compared with the inspection data to inspect the patterns. The creation method includes a step S2, where in each piece of design data of the plurality of photomasks, corner treatment is carried out on the data corresponding to a corner part of the pattern, and a step S3, wherein based on the design data of the plurality of photo-masks subjected to the corner treatment. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008147584(A) 申请公布日期 2008.06.26
申请号 JP20060336091 申请日期 2006.12.13
申请人 TOSHIBA CORP 发明人 USUI SATOSHI;KANAI HIDEKI;HASHIMOTO KOJI
分类号 H01L21/66;H01L21/027 主分类号 H01L21/66
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