发明名称 METHODS AND SYSTEMS FOR CONTROLLING A SEMICONDUCTOR FABRICATION PROCESS
摘要 Software for controlling processes in a heterogeneous semiconductor manufacturing environment may include a wafer-centric database, a real-time scheduler using a neural network, and a graphical user interface displaying simulated operation of the system. These features may be employed alone or in combination to offer improved usability and computational efficiency for real time control and monitoring of a semiconductor manufacturing process. More generally, these techniques may be usefully employed in a variety of real time control systems, particularly systems requiring complex scheduling decisions or heterogeneous systems constructed of hardware from numerous independent vendors.
申请公布号 US2008155442(A1) 申请公布日期 2008.06.26
申请号 US20070877096 申请日期 2007.10.23
申请人 发明人 PANNESE PATRICK D.;KAVATHEKAR VINAYA;VAN DER MEULEN PETER
分类号 G06F3/048 主分类号 G06F3/048
代理机构 代理人
主权项
地址