发明名称 DUAL-BIT MEMORY DEVICE HAVING TRENCH ISOLATION MATERIAL DISPOSED NEAR BIT LINE CONTACT AREAS
摘要 <p>A dual-bit memory device is provided which includes trench isolation material disposed near bit line contact areas. For example, in one implementation a semiconductor memory device (600) is provided in which each memory cell can store two bits of information. The memory device comprises a substrate (554), first and second buried bit lines (501, 502) in the substrate (554), a first bit line contact (580) on the first buried bit line (501), a second bit line contact (582) on the second buried bit line (502), and an insulator region (576) disposed in the substrate (554) between the first buried bit line (501) and the second buried bit line (502). The insulator region (576) prevents a current from flowing between the first buried bit line (501) and the second buried bit line (502).</p>
申请公布号 WO2008076978(A1) 申请公布日期 2008.06.26
申请号 WO2007US87782 申请日期 2007.12.17
申请人 SPANSION LLP;ZHENG, WEI 发明人 ZHENG, WEI
分类号 H01L21/8247;G11C16/04;H01L21/762;H01L21/768;H01L27/02;H01L27/115 主分类号 H01L21/8247
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