发明名称 Doped phase change material and pram including the same
摘要 Provided are a doped phase change material and a phase change memory device including the phase change material. The phase change material, which may be doped with Se, has a higher crystallization temperature than a Ge<SUB>2</SUB>Sb<SUB>2</SUB>Te<SUB>5 </SUB>(GST) material. The phase change material may be In<SUB>X</SUB>Sb<SUB>Y</SUB>Te<SUB>Z</SUB>Se<SUB>100-(X+Y+Z)</SUB>. The index X of indium (In) is in the range of 25 wt %<=X<=60 wt %. The index Y of antimony (Sb) is in the range of 1 wt %<=Y<=17 wt %. The index Z of tellurium (Te) is in the range of 0 wt %<Z<=75 wt %.
申请公布号 US2008149908(A1) 申请公布日期 2008.06.26
申请号 US20070980431 申请日期 2007.10.31
申请人 KHANG YOON-HO;WAMWANGI DANIEL;WUTTIG MATTHIAS;KIM KI-JOON;SUH DONG-SEOK 发明人 KHANG YOON-HO;WAMWANGI DANIEL;WUTTIG MATTHIAS;KIM KI-JOON;SUH DONG-SEOK
分类号 H01L45/00;C01B19/00 主分类号 H01L45/00
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