发明名称 Chemical mechanical polishing pad
摘要 A chemical mechanical polishing pad is suitable for polishing at least one of semiconductor, optical and magnetic substrates. The polishing pad has a high modulus component forming a continuous polymeric matrix and an impact modifier within the continuous polymeric matrix. The high modulus component has a modulus of at least 100 MPa. The impact modifier includes a low modulus component having a modulus of at least one order of magnitude less than the high modulus component that increases the impact resistance of the polishing pad.
申请公布号 US2008153395(A1) 申请公布日期 2008.06.26
申请号 US20060644493 申请日期 2006.12.21
申请人 KULP MARY JO;JAMES DAVID B;ANTRIM ROBERT F 发明人 KULP MARY JO;JAMES DAVID B.;ANTRIM ROBERT F.
分类号 B24B1/00;B24D99/00 主分类号 B24B1/00
代理机构 代理人
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