发明名称 DISTANCE MEASURING INTERFEROMETER AND ENCODER METROLOGY SYSTEMS FOR USE IN LITHOGRAPHY TOOLS
摘要 In general, in one aspect, the invention features a system that includes a moveable stage, an interferometer configured to provide information about a first degree of freedom of the stage, an encoder configured to provide information about a second degree of freedom of the stage, and an electronic processor configured to monitor the position of the stage based on the information about the first and second degrees of freedom.
申请公布号 WO2008061186(A3) 申请公布日期 2008.06.26
申请号 WO2007US84819 申请日期 2007.11.15
申请人 ZYGO CORPORATION;HILL, HENRY A. 发明人 HILL, HENRY A.
分类号 G01B11/02 主分类号 G01B11/02
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