发明名称 SYSTEM AND METHOD FOR DETECTING FAULTS OF BACKLIGHT ASSEMBLY
摘要 A system and a method for detecting a poor LED(Light Emitting Diode) of a backlight assembly are provided to measure a current flowing through an LED array or a voltage applied to the LED array to detect a poor LED included in the backlight assembly correctly. A system(400) for detecting a poor LED of a backlight assembly having an LED array as a light source includes a power supply(410), a comparator(420), and a display unit(430). The backlight assembly uses the LED array as a light source. The power supply is connected to the LED array and provides power to the LED array. The comparator is connected to the LED array, receives current flowing through the LED array, compares the received current with a reference current and outputs a comparison signal which represents whether the LED array is poor. The display unit receives the comparison signal and displays whether the LED array is poor.
申请公布号 KR20080058861(A) 申请公布日期 2008.06.26
申请号 KR20060133031 申请日期 2006.12.22
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 HA, YOUNG SUK
分类号 G02F1/13 主分类号 G02F1/13
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