发明名称 SENSE AMPLIFIER CIRCUIT OF SEMICONDUCTOR MEMORY DEVICE AND OPERATION METHOD THERE-OF
摘要 A sense amplifier circuit of a semiconductor memory device and an operation method thereof are provided to improve data sensing characteristics, and to reduce chip size by removing or reducing a dummy cell. A bit line sense amplifier(611,612) is connected to a bit line, and senses and amplifies a signal of the bit line. A calibration circuit(620) calibrates a voltage level of the bit line on the basis of a logic threshold of the bit line sense amplifier. After the voltage level of the bit line is calibrated, the bit line sense amplifier senses and amplifies a signal of the bit line. The bit line sense amplifier comprises a 2-stage cascade type latch.
申请公布号 KR20080058950(A) 申请公布日期 2008.06.26
申请号 KR20060133208 申请日期 2006.12.22
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, MYEONG O;KIM, SOO HWAN;LEE, JONG CHEOL
分类号 G11C7/06;G11C5/14;G11C7/12 主分类号 G11C7/06
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