| 摘要 |
<p>The present invention relates to a method of measuring a temperature and/or temperature distribution at a resolution < 1 ¼m in an object and to a device for performing such method, more particularly to a microscope for performing such method.
The method comprises applying a molecular thermometer embedded in a matrix layer on an object, photoexciting the said molecular thermometer with a light source of said microscope and measuring emission of radiation from said molecular thermomether with two photodetectors of said microscope. A first intensity at a first wavelength is measured by said first detector, a second intensity at a second wavelength is measured by said second detector, and a ratio of said intensities is calculated and used to determine a temperature with a calibrated curve.
Said microscope is a confocal microscope or a stimulated emission depletion (STED) microscope.</p> |
