发明名称 SEMICONDUCTOR DEVICES AND METHOD OF MAKING THE SAME
摘要 A semiconductor device and a method for forming the same are provided to reduce contact resistance due to a contact surface between a upper contact surface and an upper wire by only a process of additionally etching an upper surface of an inter layer dielectric. A method for forming a semiconductor device includes: forming an interlayer dielectric(20') on a substrate(10) on which a lower wire and a device are formed; patterning the interlayer dielectric to form a contact hole partially exposing the lower wire and the device; stacking a metal layer for a plug on the substrate in which the contact hole is formed and removing the metal layer for the plug stacked on an upper surface of the interlayer dielectric to leave a contact plug(30) in the contact hole; blank-etching the interlayer dielectric to protrude an upper portion of the contact plug on an upper surface of the interlayer dielectric; and stacking and patterning an upper wire layer on the substrate to form an upper wire.
申请公布号 KR20080058038(A) 申请公布日期 2008.06.25
申请号 KR20060132073 申请日期 2006.12.21
申请人 DONGBU ELECTRONICS CO., LTD. 发明人 PARK, CHAN HYUK
分类号 H01L21/3205;H01L21/28 主分类号 H01L21/3205
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