发明名称 |
SEMICONDUCTOR DEVICES AND METHOD OF MAKING THE SAME |
摘要 |
A semiconductor device and a method for forming the same are provided to reduce contact resistance due to a contact surface between a upper contact surface and an upper wire by only a process of additionally etching an upper surface of an inter layer dielectric. A method for forming a semiconductor device includes: forming an interlayer dielectric(20') on a substrate(10) on which a lower wire and a device are formed; patterning the interlayer dielectric to form a contact hole partially exposing the lower wire and the device; stacking a metal layer for a plug on the substrate in which the contact hole is formed and removing the metal layer for the plug stacked on an upper surface of the interlayer dielectric to leave a contact plug(30) in the contact hole; blank-etching the interlayer dielectric to protrude an upper portion of the contact plug on an upper surface of the interlayer dielectric; and stacking and patterning an upper wire layer on the substrate to form an upper wire.
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申请公布号 |
KR20080058038(A) |
申请公布日期 |
2008.06.25 |
申请号 |
KR20060132073 |
申请日期 |
2006.12.21 |
申请人 |
DONGBU ELECTRONICS CO., LTD. |
发明人 |
PARK, CHAN HYUK |
分类号 |
H01L21/3205;H01L21/28 |
主分类号 |
H01L21/3205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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