发明名称 A METHOD FOR MEASURING AREA, QUANTITY, AND HEIGHT OF SPACER
摘要 A method for measuring area, quantity, and height of a ball spacer is provided to check an arrangement of the ball spacer by measuring the height of a stacked ball spacer. A method for measuring area, quantity, and height of a ball spacer(30) includes the steps of: setting the focus depth of a measuring instrument to a first predetermined height, desirably the radius of the ball spacer, above a glass substrate(10); checking the ball spacers at the first predetermined height; moving the focus depth of the measuring instrument up to a second predetermined height, desirably 3/2 of the radius of the ball spacer, above the substrate; checking the ball spacers at the second predetermined height; and calculating the number of the ball spacers by dividing the entire area by the area per ball spacer.
申请公布号 KR20080057482(A) 申请公布日期 2008.06.25
申请号 KR20060130825 申请日期 2006.12.20
申请人 SNU PRECISION CO., LTD. 发明人 KIM, TAI WOOK
分类号 G01B21/28;G01B21/00;G01B21/10 主分类号 G01B21/28
代理机构 代理人
主权项
地址
您可能感兴趣的专利