发明名称 |
ELASTOMER-MODIFIED CHEMICAL MECHANICAL POLISHING PAD |
摘要 |
An elastomer-modified chemical mechanical polishing pad is provided to increase the number of degrees of freedom and to vary pad properties over wide ranges by presenting an elastomeric phase. An elastomer-modified chemical mechanical polishing pad comprises a polymeric matrix with an elastomeric polymer distributed within the polymeric matrix. The polymeric matrix has a glass transition above room temperature. The elastomeric polymer has a glass transition temperature below room temperature and an average length of at least 0.1mum in at least one direction. The elastomeric polymer represents 1 to 45 volume percent of polishing pad and the elastic polymer has a glass transition temperature below room temperature. The polishing pad has an increased diamond conditioner cutting rate in comparison to a polishing pad formed from the polymeric matrix without the elastomeric polymer.
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申请公布号 |
KR20080058249(A) |
申请公布日期 |
2008.06.25 |
申请号 |
KR20070134529 |
申请日期 |
2007.12.20 |
申请人 |
ROHM AND HAAS ELECTRONIC MATERIALS CMP HOLDINGS, INC. |
发明人 |
KULP MARY JO;JAMES DAVID B.;CRUZ CARLOS A. |
分类号 |
B24D11/00;B24D99/00;B24B37/00;H01L21/302;H01L21/461 |
主分类号 |
B24D11/00 |
代理机构 |
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地址 |
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