发明名称 ELASTOMER-MODIFIED CHEMICAL MECHANICAL POLISHING PAD
摘要 An elastomer-modified chemical mechanical polishing pad is provided to increase the number of degrees of freedom and to vary pad properties over wide ranges by presenting an elastomeric phase. An elastomer-modified chemical mechanical polishing pad comprises a polymeric matrix with an elastomeric polymer distributed within the polymeric matrix. The polymeric matrix has a glass transition above room temperature. The elastomeric polymer has a glass transition temperature below room temperature and an average length of at least 0.1mum in at least one direction. The elastomeric polymer represents 1 to 45 volume percent of polishing pad and the elastic polymer has a glass transition temperature below room temperature. The polishing pad has an increased diamond conditioner cutting rate in comparison to a polishing pad formed from the polymeric matrix without the elastomeric polymer.
申请公布号 KR20080058249(A) 申请公布日期 2008.06.25
申请号 KR20070134529 申请日期 2007.12.20
申请人 ROHM AND HAAS ELECTRONIC MATERIALS CMP HOLDINGS, INC. 发明人 KULP MARY JO;JAMES DAVID B.;CRUZ CARLOS A.
分类号 B24D11/00;B24D99/00;B24B37/00;H01L21/302;H01L21/461 主分类号 B24D11/00
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