发明名称 PLASMA PROCESSING APPARATUS
摘要 A plasma processing apparatus is provided to improve efficiency of a plasma processing on a surface of a workpiece by concentrating plasma around immediately below an opening at a lower end of a hollow that is penetrated. A plasma processing apparatus includes a first electrode(2), a workpiece stage(100), a second electrode(3), an exhaust portion(5) of process gas, a power source circuit(7), and a gas supply means(8). The first electrode has a hollow which penetrates from an upper end to a lower end. A workpiece is placed on the workpiece stage. The exhaust portion of process gas is formed on an outer circumference side of an opening at a lower end of the hollow along a circumference direction. The power source circuit has a power source applying a voltage between the first electrode and the second electrode. The gas supply means supplies process gas to generate plasma to the exhaust portion of process gas.
申请公布号 KR20080058178(A) 申请公布日期 2008.06.25
申请号 KR20070125325 申请日期 2007.12.05
申请人 SEIKO EPSON CORPORATION 发明人 GOMI KAZUHIRO
分类号 H01L21/3065 主分类号 H01L21/3065
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