发明名称 APPARATUS AND METHOD OF DETECTING IONIC MATERIALS WITH REDUCED NOISE
摘要 An apparatus and a method of detecting ionic materials are provided to reduce electrical property differences between transistors in the ionic material detecting apparatus as well as to reduce noise. An apparatus of detecting ionic materials includes a sensing electrode(31), first to third switching transistors(TR1,TR2,TR3), a sensing transistor(STR), a voltage detector(33), and a voltage subtracter(35). The sensing electrode detects a sensing voltage by contacting liquid sample. The first switching transistor transmits the sensing voltage to a first node. The second switching transistor transmits a reset voltage to the first node. The third switching transistor connects the sensing transistor to the voltage detector. The sensing transistor is connected to the voltage detector and the third transistor and has a gate connected to the first node. The voltage detector detects a voltage applied to a gate of the sensing transistor. The voltage subtracter calculates a difference of voltages applied to the gate of the sensing transistor in sequence.
申请公布号 KR20080057488(A) 申请公布日期 2008.06.25
申请号 KR20060130841 申请日期 2006.12.20
申请人 SAMSUNG ELECTRONICS CO., LTD.;REGENTS OF THE UNIVERSITY OF MINNESOTA 发明人 YOO, KYU TAE;KIM, SEONG JIN;YOON, EUI SIK
分类号 G01N27/27;G01N27/30 主分类号 G01N27/27
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