发明名称 |
Method of manufacturing an SOI substrate combining silicon-based areas and GaAs-based areas |
摘要 |
<p>The method involves providing a silicon-on-insulator substrate comprising a silicon support (2) with a silicon based thin layer whose orientation is parallel to a plane. A zone of the thin layer is preserved, and a non-preserved zone of the thin layer is removed till a dielectric layer (3) is exposed. The dielectric layer is opened in the non-preserved zone till a silicon face of the support is exposed. A disoriented germanium layer (7) is grown on the dielectric layer by liquid phase epitaxy or lateral epitaxy. Growth of gallium arsenide zone (8) is obtained from the disoriented germanium.</p> |
申请公布号 |
EP1936669(A1) |
申请公布日期 |
2008.06.25 |
申请号 |
EP20070123409 |
申请日期 |
2007.12.17 |
申请人 |
COMMISSARIAT A L'ENERGIE ATOMIQUE |
发明人 |
CLAVELIER, LAURENT;DEGUET, CHRYSTAL |
分类号 |
H01L21/20;H01L21/762;H01L21/8258 |
主分类号 |
H01L21/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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