发明名称 Method of manufacturing an SOI substrate combining silicon-based areas and GaAs-based areas
摘要 <p>The method involves providing a silicon-on-insulator substrate comprising a silicon support (2) with a silicon based thin layer whose orientation is parallel to a plane. A zone of the thin layer is preserved, and a non-preserved zone of the thin layer is removed till a dielectric layer (3) is exposed. The dielectric layer is opened in the non-preserved zone till a silicon face of the support is exposed. A disoriented germanium layer (7) is grown on the dielectric layer by liquid phase epitaxy or lateral epitaxy. Growth of gallium arsenide zone (8) is obtained from the disoriented germanium.</p>
申请公布号 EP1936669(A1) 申请公布日期 2008.06.25
申请号 EP20070123409 申请日期 2007.12.17
申请人 COMMISSARIAT A L'ENERGIE ATOMIQUE 发明人 CLAVELIER, LAURENT;DEGUET, CHRYSTAL
分类号 H01L21/20;H01L21/762;H01L21/8258 主分类号 H01L21/20
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