发明名称 Non-volatile memory and method with control gate compensation for source line bias errors
摘要 Source line bias is an error introduced by a non-zero resistance in the ground loop of the read/write circuits. During sensing the source of a memory cell is erroneously biased by a voltage drop across the resistance and results in errors in the applied control gate and drain voltages. This error is minimized when the applied control gate and drain voltages have their reference point located as close as possible to the sources of the memory cells. In one preferred embodiment, the reference point is located at a node where the source control signal is applied. When a memory array is organized in pages of memory cells that are sensed in parallel, with the sources in each page coupled to a page source line, the reference point is selected to be at the page source line of a selected page via a multiplexor.
申请公布号 US7391646(B2) 申请公布日期 2008.06.24
申请号 US20070624627 申请日期 2007.01.18
申请人 SANDISK CORPORATION 发明人 CERNEA RAUL-ADRIAN;CHAN SIU LUNG
分类号 G11C11/34;G11C16/04 主分类号 G11C11/34
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