| 摘要 |
Methods and apparatus are provided for testing digital circuits. In one implementation, a scan chain test structure is provided that includes a cell chain, a first scan chain, and a second scan chain. The first scan chain is operable to test digital circuitry within a first portion of the cell chain, and the second scan chain is operable to test digital circuitry within a second portion of the cell chain. The first scan chain is further operable to test digital circuitry within the second scan chain, and the second scan chain is further operable to test digital circuitry within the first scan chain.
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